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Journal of Engineering and Applied Sciences
Microcracks as a prelude to treeing in solid dielectrics.
Author(s)
Naeem Arbab
Electrical Engineering Department, NWFP University of Engineering & Technology, Peshawar, Pakistan
Mushtaq Shehnaz
Physics Department, Jinnah College for Women, University of Peshawar, Peshawar, Pakistan
Abstract
The work described suggests a possible mechanism of tree growth (propagation) within solid dielectric such as cables. An experiment was carried out using polyester specimens with a conductive film deposited under high vacuum. A device was designed and developed which produced simulated discharges of varying intensity. Inspection of damage by exploding the conducting film by discharges was carried out under a high magnification microscope.
Publication Details
Page(s)
7-14
DOI
DOI not available
Published
Journal: Journal of Engineering and Applied Sciences, Volume: 11, Issue: 2, Year: 1992
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