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Graphical diagnostics methods based on generalized residuals for logistic regression models.

Author(s)
Maria Del Carmen Pardo Department of Statistics and O.R.UP, I) Complutense University of Madrid
Paola Viviani Department of Public Health, Faculty of Medicine, Pontificia Universidad Catolica de Chile
Abstract
The logistic regression model is remarkably flexible. Nevertheless, lack of fit may also occur so to be able to detect departures from the model is important. In this paper, a generalized empirical probability plot based on generalized residuals is developed. The method is illustrated with simulated and real data.
Publication Details
Page(s) 495-512
DOI DOI not available
Published Journal: Pakistan Journal of Statistics, Volume: 28, Issue: 4, Year: 2012

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