No Detail Found!

Textural features observed under polarized light microscopy.

Author(s)
F. Habiby Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
Z. Ahmad Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
S. Khan Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
A. Ul. Haq Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
A. Q. Khan Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
Abstract
Polarized microscopy can be used for semi-quantitative determination of crystal orientation. Due to difference in colour or grey contrast, polarized microscopy can be used to identify inclusions, and nucleating grains in the study of deformation and recrystalization processes. The usefulness of polarized microscopy has been demonstrated which shows microstructural features of various levels of grey colour contrast due to orientation differences. An X-ray Orientation Distribution Plot (ODF) is also presented to substantiate the inferences drawn on the basis of metllographic examination.
Publication Details
Page(s) 123-126
DOI DOI not available
Published Journal: Pakistan Journal of Scientific and Industrial Research, Volume: 38, Issue: 3--4, Year: 1995

Request the full text from PASTIC

More from Pakistan Journal of Scientific and Industrial Research
0

Citations

0

Downloads

64

Views

Copyright ©  PASTIC National Center, Islamabad www.pastic.gov.pk