Superconductive oxides need new measurement technologies like high- resolution electron microscopy, the position-annihilation method, the photo-electron spectroscopy (XPS), the electron energy-loss spectroscopy (EELS) and other new optical methods. These technologies are necessary to determine the origin of their high temperature characteristics from inspection of the fine variation of the electron structure, the band structure, and the electron structure of such oxides besides, the usual data from measurements of the electrical, magnetic, and thermal characteristics.