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Applications of X-ray diffraction methods II: structure of amorphous materials.
Author(s)
C. A. Majid Nuclear Material Division, Pakistan Institute of Nuclear Science and Technology (PINSTECH), Islamabad, Pakistan
Abstract
In this paper different methods used to produce amorphous materials and determine their atomic structure using X-ray diffraction technique are discussed. Also structures of tetrahedrally coordinated amorphous solids like Si, Ge, Se and SiH are described. Also the influence of the structure of these solids on their physical properties is discussed.
Publication Details
Page(s) 1-10
DOI DOI not available
Published Journal: Proceedings of Pakistan Academy of Sciences, Volume: 33, Issue: 1--2, Year: 1996
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