X-ray fluorescence analysis of hafnium in hafnium-zirconium binary solution by a correction factor method of matrix effects. | Science International 1991

Author(s)

Riaz Qadeer Pakistan Institute Nuclear Science Technology, Islamabad, Pakistan

Javed Hanif Pakistan Institute Nuclear Science Technology, Islamabad, Pakistan

M. Saleem Chemistry Department, Quaid-e- Azam University (QAU), Islamabad, Pakistan

M. Afzal Chemistry Department, Quaid-e- Azam University (QAU), Islamabad, Pakistan

Abstract

Hafnium content of a hafnium-zirconium binary solution was determined by wavelength dispersive X-ray fluorescence spectrometer, using alpha-correction factor method of matrix effect. The solutions were presented to the spectrometer in simple polyethylene bottles. The method of fitting the measured Hf L 3i intensity to a non linear function of composition is also examined and the comparison between the two is made.

Publication Details

Page(s) 261-263

DOI DOI not available

Published Journal: Science International, Volume: 3, Issue: 4, Year: 1991

Keywords

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