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Textural features observed under polarized light microscopy.
Author(s):
1. F. Habiby: Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
2. Z. Ahmad: Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
3. S. Khan: Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
4. A. Ul. Haq: Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
5. A. Q. Khan: Dr.A.Q Khan Research Laboratories Kahuta, Rawalpindi, Pakistan
Abstract:
Polarized microscopy can be used for semi-quantitative determination of crystal orientation. Due to difference in colour or grey contrast, polarized microscopy can be used to identify inclusions, and nucleating grains in the study of deformation and recrystalization processes. The usefulness of polarized microscopy has been demonstrated which shows microstructural features of various levels of grey colour contrast due to orientation differences. An X-ray Orientation Distribution Plot (ODF) is also presented to substantiate the inferences drawn on the basis of metllographic examination.
Page(s): 123-126
DOI: DOI not available
Published: Journal: Pakistan Journal of Scientific and Industrial Research, Volume: 38, Issue: 3--4, Year: 1995
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