Abstract:
The use of Scanning Electron Microscope (S.E.M.) has become an important aspect of taxonomic studies. S.E.M. reveals the ultra fine features of the objects which are otherwise not observeable under the binocular dissecting microscope. However, it is difficult to interpret the results of S.E.M. studies as there was no uniform terminology. In this study an attempt has been made to describe a terminology of fruit surface as seen under S.E.M. in the sub-tribe Apiinae, family Umbelliferae. In all 13 such terms have been described which shall serve as the basis for this kind of study in other taxa of the family.
Page(s):
69-82
DOI:
DOI not available
Published:
Journal: Gomal University Journal of Research, Volume: 1, Issue: 1, Year: 1981