Abstract:
An electronic circuit has been developed to measure the fine structure in the secondary electron yield with excellent sensitivity, speed and accuracy. The considerable increase in sensitivity is achieved by obtaining the first and second derivatives of the yield using electronic modulation technique. The additional advantage of the method is that it can be used in conjunction with Auger Electron Spectroscopy simply by operating the detection system in Auger or yield fine structure mode.
Page(s):
17-20
DOI:
DOI not available
Published:
Journal: Pakistan Journal of Science, Volume: 35, Issue: 1--2, Year: 1983