Applications of X-ray diffraction methods II: structure of amorphous materials. | [Proceedings of Pakistan Academy of Sciences • 1996]

Author(s):

1. C. A. Majid: Nuclear Material Division, Pakistan Institute of Nuclear Science and Technology (PINSTECH), Islamabad, Pakistan

Abstract:

In this paper different methods used to produce amorphous materials and determine their atomic structure using X-ray diffraction technique are discussed. Also structures of tetrahedrally coordinated amorphous solids like Si, Ge, Se and SiH are described. Also the influence of the structure of these solids on their physical properties is discussed.

Page(s): 1-10

DOI: DOI not available

Published: Journal: Proceedings of Pakistan Academy of Sciences, Volume: 33, Issue: 1--2, Year: 1996

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