Abstract:
The leaf rust epidemic in 1978 shifted the focus of local wheat breeders to introduce new effective leaf rustgenes from exotic sources (often obtained from CIMMYT and USDA) to the local varieties. However, the rapid changes in rust causing pathogen (Puccinia triticina) warrant deploying more efficient technologies for screening, selection and development of new varieties. Hence the present study was designed to focus on screening the presently available resistant genes in local wheat varieties, find the effective leaf rust resistance genes and to suggest a pre-breeding plan to combat future leaf rust incidence. This study evaluates the genetics of thirty-eight commercial wheat varieties using specific molecular marker for six significant Lr genes (Lr10, Lr13, Lr21, Lr24, Lr26, Lr27 and Lr31) revealing the presence of these genes in 18, 16, 0, 0, 16, 27 and 21 varieties respectively. Thirty one commercial wheat varieties bear more than one Lr genes. To optimize the observations ABI 3730 capillary array method was used for the detection of required product of specific size with sensitivity in single nucleotide polymorphism. The STS markers showed efficiency to verify four effective genes (Lr10, Lr21, Lr24, and Lr27) in local germplasm with parallel analysis from field trial. The data provided showed that the genes (Lr10, Lr13, Lr26, and Lr27-Lr31) are widely distributed in Pakistan varieties while the absence of Lr24 and Lr21, hence provided a motivation to transfer such widely effective genes to enhance resistance through MAS breeding. Findings showed that the marker assisted selection employing sensitive ABI 3730 analysis of distributed Lr genes in Pakistani wheat will help to establish gene pyramiding against leaf rust races and hence a way forward to integrate effective genes in future wheat varieties. The reliability of STS and specific SSR marker under diverse genetic background will also be a futuristic approach.
Page(s):
116-116
DOI:
DOI not available
Published:
Journal: Abstract Book on Global Science Technology and Management Conference, Volume: 0, Issue: 0, Year: 2023